Events at Department of Energy Technology

Guest lecture by Dr. Peter Hacke

Time

02.02.2018 kl. 13.00 - 02.02.2018 kl. 14.00

Description

There will be a guest lecture on February 2

TITLE

NREL Outdoor Test Facility Activities in Reliability: PID, Combined - Accelerated Stress Testing, Microinverter Reliability, and Standards

GUEST LECTURER

Dr. Peter Hacke, National Renewable Energy Laboratory, US

TIME

13:00 - 14:00

ABSTRACT

While coulombs transferred has not been found to be a valid indicator for potential-induced degradation in crystalline silicon modules, we find it does serve to predict degradation of thin film modules in the field.  Combined-accelerated stress testing, under development, is anticipated to be a better predictor of degradation mechanism of PV modules found in the field, including PID.  Microinverters are becoming common in residential systems in the US, but unlike for PV modules, there are no generally accepted qualification tests for such power conversion electronic equipment, nor PV inverters in generally.  Progress on standardization for PV inverters will be covered.

About the lecturer

Dr. Hacke performs research in failure analysis of PV modules and accelerated lifetime testing, including for potential induced degradation, power loss, corrosion, bypass diodes, and delamination. His research interests also include modeling of degradation processes of PV modules, accelerated testing of module integrated electronics and micro inverters, and relating accelerated test results to field tests. He is also developing accelerated multi-stress, combined-accelerated stress testing to better predict occurrences of failure modes seen in the field.

THE GUEST LECTURE WILL TAKE PLACE AT Pon 105 in room 4.127 AND ALL ARE WELCOME.

 

Host

Department of Energy Technology

Address

Pontoppidanstræde 105, room 4.127